Error rate estimation for a flight application using the CEU fault injection approach

Author

Kaddour, F. ; Rezgui, S. ; Velazco, R. ; Rodriguez, S. ; De Mingo, J.R.

Author_Institution

TIMA Lab., Grenoble, France

fYear

2002

fDate

2002

Firstpage

195

Abstract

This paper aims at validating the efficiency of a fault injection approach to predict error rate on applications devoted to operate in radiation environment. Soft error injection experiments and radiation ground testing were performed on software modules using a digital board built on a digital signal processor which is included in a satellite instrument. The analysis of experimental results put in evidence the potentialities offered by the used methodology to predict the error rate of complex applications.

Keywords

digital signal processing chips; fault simulation; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; bit flips injection; code emulating an upset approach; digital signal processor; error rate estimation; fault injection; flight application; radiation environment; radiation ground testing; satellite instrument; single event upsets; soft error injection; software modules; Application software; Circuit faults; Circuit testing; Digital signal processors; Error analysis; Estimation error; Integrated circuit testing; Performance evaluation; Satellites; Single event upset;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International

Print_ISBN

0-7695-1641-6

Type

conf

DOI

10.1109/OLT.2002.1030218

Filename

1030218