DocumentCode
2203523
Title
Electrical and optical properties of carbon-related defects in GaN
Author
Armitage, R. ; Yang, Q. ; Weber, E.R. ; Fang, Z.-Q. ; Hautakangas, S. ; Saarinen, K.
fYear
2003
fDate
25-27 Aug. 2003
Firstpage
57
Lastpage
58
Abstract
The electrical and optical properties of carbon-related defects in GaN are studied. A series of samples with C concentrations varying from 5x1016 to 1x1020cm-3was characterized by SIMS, resistivity, photoluminescence, thermally simulated current, Raman scattering, and positron annihilation spectroscopy.
Keywords
III-V semiconductors; Raman spectra; carbon; crystal defects; electrical resistivity; gallium compounds; photoluminescence; positron annihilation; secondary ion mass spectra; thermally stimulated currents; wide band gap semiconductors; GaN:C; Raman scattering; SIMS; carbon-related defects; photoluminescence; positron annihilation spectra; resistivity; thermally simulated current; Conductivity; Doping; Gallium nitride; Luminescence; Mechanical factors; Photoluminescence; Positrons; Raman scattering; Spectroscopy; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 2003. International Symposium on
Print_ISBN
0-7803-7820-2
Type
conf
DOI
10.1109/ISCS.2003.1239904
Filename
1239904
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