A scan-BIST environment for testing embedded memories

Author

Karimi, F. ; Lombardi, F.

Author_Institution

LTX Corp., San Jose, CA, USA

fYear

2002

fDate

2002

Firstpage

211

Lastpage

217

Abstract

This paper presents a new IEEE 1149.1 compatible architecture as an intermediate environment for testing embedded memories. A BIST structure and a boundary scan are used for testing various memory configurations for programmability as well as improved controllability and observability. Its novelty is that features such as modularity, scalability with word size and adaptability to different memory configurations and testing requirements, are accomplished at relative ease. In the boundary scan, user-defined test modes are utilized so that basic modifications to the elements of a seed algorithm can be generated very efficiently.

Keywords

boundary scan testing; built-in self test; controllability; integrated circuit testing; integrated memory circuits; logic testing; observability; IEEE 1149.1 compatible architecture; controllability; embedded memory testing; intermediate environment; modularity; observability; programmability; scalability; scan-BIST environment; user-defined test modes; word size; Automatic testing; Built-in self-test; Computer architecture; Controllability; Embedded computing; Hardware; Observability; SRAM chips; Scalability; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International

Print_ISBN

0-7695-1641-6

Type

conf

DOI

10.1109/OLT.2002.1030221

Filename

1030221