DocumentCode :
2203924
Title :
Influence of arsenic isoelectronic Co-doping on the electronic properties of n-and p-type GaN
Author :
Guido, Louis J. ; Dickerson, Bryan D. ; Houck, William D. ; Gray, David T.
Author_Institution :
Dept. of Mater. Sci. & Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear :
2003
fDate :
25-27 Aug. 2003
Firstpage :
89
Lastpage :
90
Abstract :
GaN samples were synthesized by OMVPE using TMGa, NH3, AsH3, SiH4 and Cp2Mg as precursors, and H2 as the carrier gas. Direct comparisons between n-and p-type GaN samples with and without arsenic demonstrate that isoelectronic co-doping yields significant improvements in electronic properties. The surface morphology of both n-and p-type GaN improves considerably with the addition of AsH3 into the OMVPE environment.
Keywords :
Hall effect; III-V semiconductors; MOCVD; arsenic; gallium compounds; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; surface morphology; vapour phase epitaxial growth; wide band gap semiconductors; GaN:As; OMVPE; arsenic isoelectronic doping; electronic properties; n-type GaN; p-type GaN; surface morphology; Ash; Atom optics; Electrons; Gallium nitride; Mechanical factors; Optical sensors; Photoluminescence; Semiconductor device doping; Surface morphology; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 2003. International Symposium on
Print_ISBN :
0-7803-7820-2
Type :
conf
DOI :
10.1109/ISCS.2003.1239919
Filename :
1239919
Link To Document :
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