Title :
Model for magnetically enhanced capacitively coupled plasma discharges
Author :
Rauf, S. ; Ventzek, P. ; Sparks, T.
Author_Institution :
DigitalDNA(TM) Labs., Motorola Semicond. Products, Austin, TX, USA
Abstract :
Summary form only given. Magnetically enhanced capacitively coupled plasma (MECCP) discharges are widely used in the microelectronics industry for etching dielectric materials. MECCP etch reactors allow careful control of plasma chemistry, which is essential for developing selective etch processes.. In addition, plasma density is moderately high in MECCP reactors, thus ensuring that etch rates are reasonably large. It is anticipated that MECCP etch reactors will become even more pervasive in the microelectronics industry in the coming years. A new 2-dimensional plasma reactor model, which is capable of simulating MECCP discharges, has been developed. The model can address most commercial MECCP etch reactors for the operating range of interest as well as the relevant fluorocarbon plasma chemistries. The computational model and its applications are the subject of this paper.
Keywords :
Langmuir probes; discharges (electric); plasma chemistry; plasma materials processing; sputter etching; surface chemistry; 2-dimensional plasma reactor model; Boltzmann equation; Langmuir probe; Poisson equation; RF power; charged species dynamics; computational model; continuity equations; dielectric materials; drift-diffusion approximation; electron temperature equation; electronegative plasma; electropositive plasma; etch rates; etch reactor; etching; fluorocarbon plasma chemistries; gas composition; gas pressure; magnetic field; magnetically enhanced capacitively coupled plasma discharge model; microelectronics industry; plasma chemistry; plasma density; species fluxes; time-independent electron temperature; Computational modeling; Couplings; Etching; Inductors; Microelectronics; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma simulation;
Conference_Titel :
Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
Conference_Location :
Banff, Alberta, Canada
Print_ISBN :
0-7803-7407-X
DOI :
10.1109/PLASMA.2002.1030239