DocumentCode
2204059
Title
Wavelet transform domain adaptive clustering for electronic product quality inspection
Author
Shcherbakova, Galina ; Krylov, V. ; Pisarenko, Radmila ; Kuzmenko, Vadym
Author_Institution
Odessa Nat. Polytech. Univ., Odessa, Ukraine
fYear
2013
fDate
12-14 Sept. 2013
Firstpage
153
Lastpage
156
Abstract
Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant change in these parameters over time, a high noise level and small samples of data.
Keywords
inspection; pattern clustering; product quality; production engineering computing; wavelet transforms; electronic product quality inspection; high noise level; information technology; multistart adaptive clustering method; product manufacturing test; wavelet transform domain adaptive clustering; Clustering methods; Manufacturing; Noise; Parameter estimation; Resistors; Standards; Time measurement; clustering; sub gradient; wavelet transfor domain;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2013 IEEE 7th International Conference on
Conference_Location
Berlin
Print_ISBN
978-1-4799-1426-5
Type
conf
DOI
10.1109/IDAACS.2013.6662660
Filename
6662660
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