DocumentCode :
2204068
Title :
Laser direct write for wide-band gap semiconductor device fabrication: doping
Author :
Salama, I.A. ; Quick, N.R. ; Kar, A.
Author_Institution :
Sch. of Opt., Central Florida Univ., Orlando, FL, USA
fYear :
2003
fDate :
25-27 Aug. 2003
Firstpage :
102
Lastpage :
103
Abstract :
Wide-band gap semiconductor materials promise superior operational voltages, temperatures and frequencies compared to those of silicon. A new and simple process based on laser induced phase transformations is formed as a solution to wide-bandgap material integration issues caused by incompatibilities with conventional dielectric deposition, etching, oxidation, metallization and doping technologies. Laser coupling with wide-bandgap semiconductors selectively converts irradiated regions to conductors, semiconductors or insulators. In this process metallization for drains, sources, interconnects, vias and contacts is intrinsic, without the addition of metals and doping is accomplished using primarily gaseous dopant sources. Laser doping of 4H-SiC is described in this paper.
Keywords :
aluminium; laser materials processing; nitrogen; semiconductor device metallisation; semiconductor doping; silicon compounds; wide band gap semiconductors; SiC:Al; SiC:N; dielectric deposition; etching; gaseous dopant source; insulators; interconnects; laser coupling; laser doping; laser doping technology; laser induced phase transformation; metallization; oxidation; silicon; wide bandgap semiconductor device fabrication; Conducting materials; Gas lasers; Metallization; Optical device fabrication; Semiconductor device doping; Semiconductor devices; Semiconductor lasers; Semiconductor materials; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 2003. International Symposium on
Print_ISBN :
0-7803-7820-2
Type :
conf
DOI :
10.1109/ISCS.2003.1239926
Filename :
1239926
Link To Document :
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