Title :
Manifold regression for subsurface contaminant characterization
Author :
Zhang, Hao ; Mendoza-Sanchez, Itza ; Abriola, Linda ; Miller, Eric L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Abstract :
Characterization of sites contaminated by chemicals such as trichloroethylene, perchloroethylene, and other dense non-aqueous phase liquids (DNAPLs) is a necessary first step in the design and implementation of successful remediation strategies. In this paper, we develop a machine learning-based approach for estimating characteristics of a source zone related to the distribution of contaminant mass in highly saturated pool regions and more diffuse ganglia based on observations of down-gradient concentration images. After extracting a set of morphological features from training images, Laplacian Eigenmaps is employed to embed these features with the known source zone metric in a low dimensional manifold. A spectral regression scheme is used to embed the test data into the same manifold after which a Bayesian approach is employed to estimate the associated metric as well as a confidence interval. Results based upon simulated data demonstrate the potential effectiveness of the overall approach.
Keywords :
environmental science computing; learning (artificial intelligence); organic compounds; regression analysis; water pollution control; water pollution measurement; DNAPL; Laplacian eigenmaps; contaminant mass distribution; dense nonaqueous phase liquids; down gradient concentration images; highly saturated pool regions; machine learning based approach; manifold regression; morphological features; perchloroethylene; remediation strategies; source zone; spectral regression scheme; subsurface contaminant characterization; training images; trichloroethylene; Bayesian methods; Laplace equations; Level set; Manifolds; Measurement; Training data; Vectors; Bayesian Regression; Laplacian Eigenmaps; Level Set Method; Machine Learning; Spectral Regression;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6351068