DocumentCode :
2204274
Title :
Texture Classification Using Uniform Extended Local Ternary Patterns
Author :
Liao, Wen-Hung ; Young, Ting-Jung
Author_Institution :
Dept. of Comput. Sci., Nat. Chengchi Univ., Taipei, Taiwan
fYear :
2010
fDate :
13-15 Dec. 2010
Firstpage :
191
Lastpage :
195
Abstract :
We present an extension to the well-known local binary pattern (LBP) feature descriptor. The newly defined descriptor known as extended local ternary pattern (ELTP) exhibits better noise resistivity than the original LBP, while maintaining computational simplicity. We further investigate the presence of uniform patterns in ELTP. With a slight modification in the definition of uniformity, it is found experimentally that uniform ELTP account for 80% of all patterns in texture images. Comparative performance analysis indicates that the proposed uniform ELTP is more effective than uniform LBP for texture classification tasks.
Keywords :
image classification; image denoising; image texture; computational simplicity; local binary pattern feature descriptor; noise resistivity; texture classification; texture images; uniform extended local ternary patterns; local ternary patterns; texture classification; uniform pattern;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia (ISM), 2010 IEEE International Symposium on
Conference_Location :
Taichung
Print_ISBN :
978-1-4244-8672-4
Electronic_ISBN :
978-0-7695-4217-1
Type :
conf
DOI :
10.1109/ISM.2010.35
Filename :
5693840
Link To Document :
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