DocumentCode
2204274
Title
Texture Classification Using Uniform Extended Local Ternary Patterns
Author
Liao, Wen-Hung ; Young, Ting-Jung
Author_Institution
Dept. of Comput. Sci., Nat. Chengchi Univ., Taipei, Taiwan
fYear
2010
fDate
13-15 Dec. 2010
Firstpage
191
Lastpage
195
Abstract
We present an extension to the well-known local binary pattern (LBP) feature descriptor. The newly defined descriptor known as extended local ternary pattern (ELTP) exhibits better noise resistivity than the original LBP, while maintaining computational simplicity. We further investigate the presence of uniform patterns in ELTP. With a slight modification in the definition of uniformity, it is found experimentally that uniform ELTP account for 80% of all patterns in texture images. Comparative performance analysis indicates that the proposed uniform ELTP is more effective than uniform LBP for texture classification tasks.
Keywords
image classification; image denoising; image texture; computational simplicity; local binary pattern feature descriptor; noise resistivity; texture classification; texture images; uniform extended local ternary patterns; local ternary patterns; texture classification; uniform pattern;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia (ISM), 2010 IEEE International Symposium on
Conference_Location
Taichung
Print_ISBN
978-1-4244-8672-4
Electronic_ISBN
978-0-7695-4217-1
Type
conf
DOI
10.1109/ISM.2010.35
Filename
5693840
Link To Document