• DocumentCode
    2204274
  • Title

    Texture Classification Using Uniform Extended Local Ternary Patterns

  • Author

    Liao, Wen-Hung ; Young, Ting-Jung

  • Author_Institution
    Dept. of Comput. Sci., Nat. Chengchi Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    13-15 Dec. 2010
  • Firstpage
    191
  • Lastpage
    195
  • Abstract
    We present an extension to the well-known local binary pattern (LBP) feature descriptor. The newly defined descriptor known as extended local ternary pattern (ELTP) exhibits better noise resistivity than the original LBP, while maintaining computational simplicity. We further investigate the presence of uniform patterns in ELTP. With a slight modification in the definition of uniformity, it is found experimentally that uniform ELTP account for 80% of all patterns in texture images. Comparative performance analysis indicates that the proposed uniform ELTP is more effective than uniform LBP for texture classification tasks.
  • Keywords
    image classification; image denoising; image texture; computational simplicity; local binary pattern feature descriptor; noise resistivity; texture classification; texture images; uniform extended local ternary patterns; local ternary patterns; texture classification; uniform pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia (ISM), 2010 IEEE International Symposium on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-8672-4
  • Electronic_ISBN
    978-0-7695-4217-1
  • Type

    conf

  • DOI
    10.1109/ISM.2010.35
  • Filename
    5693840