• DocumentCode
    2204322
  • Title

    High-Accuracy Image Centroiding Algorithm for CMOS-Based Digital Sun Sensors

  • Author

    Chang, Young-Keun ; Lee, Byung-Hoon ; Kang, Seok-Jin

  • Author_Institution
    Korea Aerosp. Univ., Goyang
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    329
  • Lastpage
    336
  • Abstract
    The digital sun sensor calculates the incident sunlight angle using the sunlight image registered on a CMOS image sensor. In order to accomplish this, an exact center of the sunlight image has to be determined. Therefore, an accurate estimate of the centroid is the most important factor in digital sun sensor development. The most general method for determining the centroid is the thresholding method, and this method is also the simplest and easy to implement. Another centering algorithm often used is the image filtering method that utilizes image processing. The sun sensor accuracy using these methods, however, is quite susceptible to noise in the detected sunlight intensity. This is especially true in the thresholding method where the accuracy changes according to the threshold level. In this paper, a template method that uses the sunlight image model to determine the centroid of the sunlight image is suggested, and the performance has been compared and analyzed. The template method suggested, unlike the thresholding and image filtering method, has comparatively higher accuracy. In addition, it has the advantage of having consistent level of accuracy regardless of the noise level, which results in a higher reliability.
  • Keywords
    CMOS image sensors; image processing; sunlight; CMOS image sensor; digital sun sensors; high-accuracy image centroiding; image filtering; image processing; sunlight image model; Aerospace engineering; CMOS image sensors; Filtering; Image sensors; Magnetic sensors; Mechanical engineering; Mechanical sensors; Position measurement; Satellites; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388403
  • Filename
    4388403