Title :
Hazard detection in combinational and sequential switching circuits
Author :
Eichelberger, E.B.
Keywords :
Boolean algebra; Boolean functions; Delay; Hazards; Input variables; Laboratories; Logic gates; Multivalued logic; Sequential circuits; Switching circuits;
Conference_Titel :
Switching Circuit Theory and Logical Design, 1964 Proceedings of the Fifth Annual Symposium on
Conference_Location :
Princeton, NJ, USA
DOI :
10.1109/SWCT.1964.11
