DocumentCode :
2204457
Title :
The potential and realization of multi-layers three-dimensional integrated circuit
Author :
Chan, Mansun
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
40
Abstract :
3D IC technology with transistors stacked on top of one another in multiple silicon layers has long been a vision for future technology directions to provide a breakthrough towards higher circuit density and functionality. While the idea is simple, techniques to obtain high performance multi-layer transistors are extraordinarily difficult, and it is only recently that such technology has become feasible. In this paper, various techniques to form 3D circuits are reviewed. Recent development of a promising technology to achieve three-dimensional integration using metal-induced-lateral-crystallization is described. Preliminary results for 3D inverters and ring-oscillators have demonstrated the viability of 3D integrated circuits. Finally, the challenges for realization of 3D circuits are discussed
Keywords :
CMOS integrated circuits; crystallisation; elemental semiconductors; integrated circuit metallisation; integrated circuit testing; logic gates; oscillators; silicon; 3D IC technology; 3D circuit techniques; 3D circuit technology; 3D integrated circuits; 3D integration technology; 3D inverters; 3D ring-oscillators; Si; circuit density; circuit functionality; metal-induced-lateral-crystallization; multi-layer transistors; multilayer 3D integrated circuits; multiple silicon layers; recrystallization; stacked CMOS structures; stacked transistors; thin-film-transistors; wafer bonding; CMOS technology; Crystalline materials; Germanium; Integrated circuit technology; MOSFET circuits; Semiconductor films; Silicon; Stacking; Three-dimensional integrated circuits; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6520-8
Type :
conf
DOI :
10.1109/ICSICT.2001.981421
Filename :
981421
Link To Document :
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