Title :
Robust Defect Detection Using Improved Higher Order Wavelet Descriptors and Support Vector Machines for Visual Inspection Systems.
Author :
Karras, Dimitrios A.
Keywords :
Discrete wavelet transforms; Inspection; Pattern recognition; Robustness; Support vector machine classification; Support vector machines; Vector quantization; Wavelet analysis; Wavelet coefficients; Wavelet domain;
Conference_Titel :
Imagining Systems and Techniques, 2006. IST 2006. Proceedings of the 2006 IEEE International Workshop on [Imagining read Imaging]
Print_ISBN :
1-4244-0251-4
DOI :
10.1109/IST.2006.1650799
