• DocumentCode
    2204808
  • Title

    An Overview of Near-field Sub-millimeter Wave Antenna Test Applications

  • Author

    van Rensburg, Daniel Janse ; Hindman, Greg

  • Author_Institution
    Nearfield Syst. Inc, Torrance, CA
  • fYear
    2008
  • fDate
    23-24 April 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper provides an overview of planar near- field antenna test systems developed for submillimeter wave applications used for earth observation and radio astronomy. Examples are shown of some of these test systems and methods described to overcome technical restrictions, limiting performance at very high RF frequencies. Aspects like thermal structural change, RF cable phase instability and scanner planarity are addressed. These methods have been implemented and validated on practical real-world applications up to 660 GHz and 950 GHz. These extreme cases have lead to the development of low cost commercial test systems, making antenna testing in the V and W-bands cost effective and viable today.
  • Keywords
    antenna testing; radioastronomical techniques; submillimetre wave antennas; V band; W band; antenna testing; earth observation; near-field submillimeter wave antenna test; planar near-field antenna test systems; radio astronomy; Aperture antennas; Astronomy; Costs; Earth; NASA; Poles and towers; Radio frequency; System testing; Technological innovation; Tracking; Antennatest; Motion Tracking; Planar Near-field scanner; Sub-millimeter; Thermal drift;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Techniques, 2008. COMITE 2008. 14th Conference on
  • Conference_Location
    Prague
  • Print_ISBN
    978-1-4244-2137-4
  • Electronic_ISBN
    978-1-4244-2138-1
  • Type

    conf

  • DOI
    10.1109/COMITE.2008.4569882
  • Filename
    4569882