Title :
Novel statistical technique of defective information extraction in pulsed eddy current NDE
Author :
Yang, Guang ; Zhang, Qi ; Yang, Yuning ; Tian, Gui Yun
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
The pulsed eddy current (PEC) technique as complementary approach of traditional eddy current method has found increasing applications in deep flaw detection and complex structure inspection. Considering the present PEC NDE (non-destructive evaluation) needs valid algorithms and techniques to implement signal processing in time domain, the novel statistical technique based on principle component analysis (PCA) and independent component analysis (ICA) is proposed to extract defective information from transient PEC signals and evaluate flaw inspection during the PEC detection. The presented results of defect classification associated with different flaw types validated the feasibility of proposed technique in this paper.
Keywords :
flaw detection; principal component analysis; signal processing; complex structure inspection; deep flaw detection; defective information extraction; flaw inspection; independent component analysis; principle component analysis; pulsed eddy current NDE; time domain signal processing; Data mining; Eddy currents; Feature extraction; Inspection; Integrated circuit modeling; Principal component analysis; Testing; Pulsed eddy current; defect classification; defective information; statistical technique;
Conference_Titel :
Information and Automation (ICIA), 2011 IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4577-0268-6
Electronic_ISBN :
978-1-4577-0269-3
DOI :
10.1109/ICINFA.2011.5949106