DocumentCode
22049
Title
Resilient Batch-Fabricated Planar Arrays of Miniaturized Langmuir Probes for Real-Time Measurement of Plasma Potential Fluctuations in the HF to Microwave Frequency Range
Author
Chimamkpam, Emmanuel F. C. ; Field, Ella S. ; Akinwande, Akintunde Ibitayo ; Velasquez-Garcia, L.F.
Author_Institution
Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
23
Issue
5
fYear
2014
fDate
Oct. 2014
Firstpage
1131
Lastpage
1140
Abstract
We report the design, fabrication, and characterization of miniaturized, flush-mounted Langmuir probe arrays for RF diagnosis of plasmas in the HF to microwave range of frequencies. We developed probes of radii ≥125 μm by electroless nickel metallization of ultrasonically drilled through-substrate vias. Planar arrays with as many as 25 probes spaced 1.6 mm apart (39 probes/cm2) in Pyrex, silicon carbide, and alumina substrates were produced. The sensor system was built to have a frequency response between 2 MHz and 3 GHz, and a probe impedance greater than or within close range of the plasma sheath impedance for plasma densities ≥1016 m-3. We characterized a self-biasing nickel probe part of a 2×2 array with alumina substrate using a high-density magnetized helicon plasma source; we found that the measurement of the plasma potential from the MEMS probe compares well with independent measurements using a hot emissive probe and an ion sensitive probe. The sensor technology can be used to monitor plasma-based manufacturing systems, plasma-based energy generation systems, and as on-board plasma diagnostics in spacecraft including nanosatellites.
Keywords
Langmuir probes; helicons; metallisation; microfabrication; microsensors; nickel; plasma density; plasma fluctuations; plasma sheaths; plasma sources; plasma transport processes; vias; Al2O3; MEMS probe; Ni; RF diagnosis; SiC; electroless nickel metallization; flush-mounted Langmuir probe arrays; frequency 2 MHz to 3 GHz; frequency response; high-density magnetized helicon plasma source; hot emissive probe; ion sensitive probe; microwave frequency; miniaturized Langmuir probes; on-board plasma diagnostics; planar arrays; plasma density; plasma potential; plasma potential fluctuations; plasma sheath impedance; plasma-based energy generation systems; plasma-based manufacturing systems; real-time measurement; resilient batch-fabricated planar arrays; self-biasing nickel probe; sensor system; sensor technology; ultrasonically drilled through-substrate vias; Impedance; Micromechanical devices; Nickel; Plasma measurements; Plasmas; Probes; Substrates; Electroless plating; MEMS Langmuir probes; high-density plasma diagnostics; high-frequency plasma diagnostics; through-substrate vias; through-substrate vias.;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2014.2306631
Filename
6758352
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