• DocumentCode
    2204910
  • Title

    A novel lateral trench IGBT employing the p+ diverter having superior forward blocking and latch-up characteristics

  • Author

    Kang, Ey Goo ; Moon, Seung Hyun ; Sung, Man Young

  • Author_Institution
    Dept. of Electr. Eng., Korea Univ., Seoul, South Korea
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    139
  • Abstract
    A new Lateral Trench Insulated Gate Bipolar Transistor (LTIGBT) with p+ diverter was proposed to improve the characteristics of the conventional LTIGBT. The p+ divert layer was placed between anode electrode region and cathode electrode. Generally, if the LTIGBT had p+ divert region, forward blocking voltage was decreased, greatly because n-drift layer corresponding to punchthrough was decreased. However, the forward blocking voltage of the proposed LTIGBT with p+ diverter was 140 V. That of the conventional LTIGBT of the same size was 105 V. The forward blocking voltage of LTIGBT with p+ diverter increased 1.3 times more than those of the conventional LTIGBT. Because the p+ diverter region of the proposed device was enclosed trench oxide layer, the electric field moved toward trench-oxide layer. The latch-up current densities of the conventional LTIGBT and LTIGBT with p+ diverter were 540 A/cm2, and 1453 A/cm2, respectively. The enhanced latch-up capability of the LTEIGBT was obtained through holes in the current directly reaching the cathode via the p+ divert region and p+ cathode layer beneath n+ cathode layer
  • Keywords
    insulated gate bipolar transistors; isolation technology; power bipolar transistors; semiconductor device models; MEDICI; current-voltage characteristics; electron vectors; enhanced latch-up capability; forward blocking characteristics; hole vectors; latch-up characteristics; lateral trench IGBT; n-drift layer; p+ diverter; punch-through; turn-off characteristics; two-dimensional numerical simulations; Anodes; Cathodes; Charge carrier processes; Conductivity; Current density; Electrodes; Insulated gate bipolar transistors; Moon; Numerical simulation; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.981442
  • Filename
    981442