DocumentCode :
2205052
Title :
Application of an Integrated Microfluidic Total Internal Reflection (TIR)-based Chip to Nano-Particle Image Velocimetry (nano-PIV)
Author :
Le, Nam Cao Hoai ; Yokokawa, Ryuji ; Dao, Dzung Viet ; Nguyen, Thien Duy ; Wells, John ; Sugiyama, Susumu
Author_Institution :
Ritsumeikan Univ., Shiga
fYear :
2007
fDate :
28-31 Oct. 2007
Firstpage :
454
Lastpage :
457
Abstract :
A polymer TIR-based chip has been developed. The chip is monolithically fabricated using Si bulk micromachining and PDMS casting at very low cost. A PDMS microchannel is attached to the chip by van-der-Waals contact through a common thin glass slide to form an integrated microfluidic (TIR)-based chip. The slide-format of the microfluidic TIR-based chip can be employed with both inverted and upright fluorescent microscope. This paper reports the first application of this microfluidic TIR-based chip to study microfluidic flow by nano-PIV with an upright fluorescent microscope. Pressure-driven flows of carboxylate-modified Nile-red nanotracers are generated inside the microchannel of the microfluidic TIR-based chip. The time-sequenced fluorescent images of tracers, illuminated by evanescent field, are recorded onto a CCD camera and are cross-correlated by a PIV program to obtain the near-wall velocity field at various shear rates. Our integrated system could be an important component of a micro-total analysis system (mu-TAS) to study nanoparticles or bio-molecules transport and their near-wall interactions in a microchannel.
Keywords :
CCD image sensors; microfluidics; micromachining; van der Waals forces; CCD camera; PDMS casting; PDMS microchannel; biomolecules transport; fluorescent microscope; integrated microfluidic chip; microfluidic flow; micrototal analysis system; monolithic fabrication; mu-TAS; nanoparticle image velocimetry; silicon bulk micromachining; total internal reflection; van-der-Waals contact; Casting; Costs; Fluorescence; Glass; Microchannel; Microfluidics; Micromachining; Microscopy; Polymers; Reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2007 IEEE
Conference_Location :
Atlanta, GA
ISSN :
1930-0395
Print_ISBN :
978-1-4244-1261-7
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2007.4388434
Filename :
4388434
Link To Document :
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