• DocumentCode
    2205246
  • Title

    Challenges in analog IC design submicron CMOS technologies

  • Author

    Sansen, Willy

  • Author_Institution
    ESAT-MICAS, Katholieke Univ., Leuven, Belgium
  • fYear
    1996
  • fDate
    13-14 Sep 1996
  • Firstpage
    72
  • Lastpage
    78
  • Abstract
    In submicron CMOS devices, short-channel effects lead to shifts in threshold voltage, increased mismatch and noise. The velocity saturation limits the obtainable transconductance and hence also the high-speed performance. Lower supply voltages require the operational amplifier building block to operate rail-to-rail. In delta-sigma converters this leads to very-low-power converters. Considerable attention is given to circuit design for telecommunication applications, in which the inductor is making a comeback. The ultimate challenge-of analog design however is the cointegration with digital blocks, causing coupling noise and requiring sophisticated tools
  • Keywords
    CMOS analogue integrated circuits; VLSI; integrated circuit design; integrated circuit modelling; operational amplifiers; sigma-delta modulation; analog IC design; cointegration; coupling noise; delta-sigma converters; high-speed performance; obtainable transconductance; operational amplifier building block; rail-to-rail operation; short-channel effects; submicron CMOS technologies; threshold voltage; velocity saturation; Analog integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; CMOS technology; Integrated circuit noise; Operational amplifiers; Rail to rail amplifiers; Rail to rail operation; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Analog and Mixed IC Design, 1996., IEEE-CAS Region 8 Workshop on
  • Conference_Location
    Pavia
  • Print_ISBN
    0-7803-3625-9
  • Type

    conf

  • DOI
    10.1109/AMICD.1996.569388
  • Filename
    569388