DocumentCode
2205246
Title
Challenges in analog IC design submicron CMOS technologies
Author
Sansen, Willy
Author_Institution
ESAT-MICAS, Katholieke Univ., Leuven, Belgium
fYear
1996
fDate
13-14 Sep 1996
Firstpage
72
Lastpage
78
Abstract
In submicron CMOS devices, short-channel effects lead to shifts in threshold voltage, increased mismatch and noise. The velocity saturation limits the obtainable transconductance and hence also the high-speed performance. Lower supply voltages require the operational amplifier building block to operate rail-to-rail. In delta-sigma converters this leads to very-low-power converters. Considerable attention is given to circuit design for telecommunication applications, in which the inductor is making a comeback. The ultimate challenge-of analog design however is the cointegration with digital blocks, causing coupling noise and requiring sophisticated tools
Keywords
CMOS analogue integrated circuits; VLSI; integrated circuit design; integrated circuit modelling; operational amplifiers; sigma-delta modulation; analog IC design; cointegration; coupling noise; delta-sigma converters; high-speed performance; obtainable transconductance; operational amplifier building block; rail-to-rail operation; short-channel effects; submicron CMOS technologies; threshold voltage; velocity saturation; Analog integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; CMOS technology; Integrated circuit noise; Operational amplifiers; Rail to rail amplifiers; Rail to rail operation; Threshold voltage; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Analog and Mixed IC Design, 1996., IEEE-CAS Region 8 Workshop on
Conference_Location
Pavia
Print_ISBN
0-7803-3625-9
Type
conf
DOI
10.1109/AMICD.1996.569388
Filename
569388
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