DocumentCode
2205293
Title
A method for denoising of DC test signal
Author
Li, Xinfu ; Liu, Jiaomin
Author_Institution
Hebei Univ. of Technol., Tianjin, China
fYear
2004
fDate
21-25 June 2004
Firstpage
130
Lastpage
134
Abstract
In low voltage electrical apparatus inspection direct current test, the test signal has an abrupt changing structure because of operation of opening or closing of switchgear. Affected by strong electromagnetic field, experiment signal carries noise on testing spot. For accurate measurement test signal must be processed before analyzing its parameter. In this paper, a filter technique, wavelet shrinkage or soft threshold method that was based on wavelet transform, was introduced. Experiment results show that signal de-noising is carried out without smoothing out the over voltage, over current sharp structures.
Keywords
filtering theory; instrumentation; measurement systems; signal denoising; wavelet transforms; direct current test signal; filter technique; low voltage electrical apparatus; signal denoising; soft threshold method; wavelet shrinkage; wavelet transform; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Inspection; Low voltage; Noise reduction; Signal analysis; Signal processing; Switchgear; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Acquisition, 2004. Proceedings. International Conference on
Print_ISBN
0-7803-8629-9
Type
conf
DOI
10.1109/ICIA.2004.1373335
Filename
1373335
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