• DocumentCode
    2205293
  • Title

    A method for denoising of DC test signal

  • Author

    Li, Xinfu ; Liu, Jiaomin

  • Author_Institution
    Hebei Univ. of Technol., Tianjin, China
  • fYear
    2004
  • fDate
    21-25 June 2004
  • Firstpage
    130
  • Lastpage
    134
  • Abstract
    In low voltage electrical apparatus inspection direct current test, the test signal has an abrupt changing structure because of operation of opening or closing of switchgear. Affected by strong electromagnetic field, experiment signal carries noise on testing spot. For accurate measurement test signal must be processed before analyzing its parameter. In this paper, a filter technique, wavelet shrinkage or soft threshold method that was based on wavelet transform, was introduced. Experiment results show that signal de-noising is carried out without smoothing out the over voltage, over current sharp structures.
  • Keywords
    filtering theory; instrumentation; measurement systems; signal denoising; wavelet transforms; direct current test signal; filter technique; low voltage electrical apparatus; signal denoising; soft threshold method; wavelet shrinkage; wavelet transform; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Inspection; Low voltage; Noise reduction; Signal analysis; Signal processing; Switchgear; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Acquisition, 2004. Proceedings. International Conference on
  • Print_ISBN
    0-7803-8629-9
  • Type

    conf

  • DOI
    10.1109/ICIA.2004.1373335
  • Filename
    1373335