DocumentCode :
2205293
Title :
A method for denoising of DC test signal
Author :
Li, Xinfu ; Liu, Jiaomin
Author_Institution :
Hebei Univ. of Technol., Tianjin, China
fYear :
2004
fDate :
21-25 June 2004
Firstpage :
130
Lastpage :
134
Abstract :
In low voltage electrical apparatus inspection direct current test, the test signal has an abrupt changing structure because of operation of opening or closing of switchgear. Affected by strong electromagnetic field, experiment signal carries noise on testing spot. For accurate measurement test signal must be processed before analyzing its parameter. In this paper, a filter technique, wavelet shrinkage or soft threshold method that was based on wavelet transform, was introduced. Experiment results show that signal de-noising is carried out without smoothing out the over voltage, over current sharp structures.
Keywords :
filtering theory; instrumentation; measurement systems; signal denoising; wavelet transforms; direct current test signal; filter technique; low voltage electrical apparatus; signal denoising; soft threshold method; wavelet shrinkage; wavelet transform; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Inspection; Low voltage; Noise reduction; Signal analysis; Signal processing; Switchgear; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Acquisition, 2004. Proceedings. International Conference on
Print_ISBN :
0-7803-8629-9
Type :
conf
DOI :
10.1109/ICIA.2004.1373335
Filename :
1373335
Link To Document :
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