DocumentCode

2205574

Title

Reliability of BCB passivated InAlAs/InGaAs HEMTs under thermal stress

Author

Kim, D.H. ; Yoon, M.H. ; Kim, T.H. ; Yang, K.

Author_Institution

EECS, KAIST

fYear

2003

fDate

25-27 Aug. 2003

Firstpage

231

Lastpage

232

Keywords

HEMTs; Indium compounds; Indium gallium arsenide; MODFETs; Passivation; Polyimides; Testing; Thermal degradation; Thermal resistance; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Compound Semiconductors, 2003. International Symposium on

Print_ISBN

0-7803-7820-2

Type

conf

DOI

10.1109/ISCS.2003.1239990

Filename

1239990