DocumentCode :
2205647
Title :
An investigation of radiation-induced ageing in cable insulation via loss measurements at high and low frequencies
Author :
Banford, H.M. ; Fouracre, R.A. ; MacGregor, S.J. ; Judd, M.
Author_Institution :
Scottish Univ. Res. & Reactor Centre, East Kilbride, UK
Volume :
2
fYear :
1998
fDate :
7-10 Jun 1998
Firstpage :
558
Abstract :
Samples of coaxial signal cables, insulated with polyethylene, were irradiated in a 60Co gamma source-in ambient air to a dose of 500 kGy. Measurements of dielectric loss at low frequencies were made by means of the Hamon transform of depolarising current and measurements of insertion loss at high frequencies were carried out using a network analyser. Upon comparing the response of the irradiated cables with that of fresh unaged material it was evident that there were differences in behaviour that could be attributed to ageing. The results indicate that the effects of radiation-induced ageing in polymer cable insulation can be monitored in principle by employing nondestructive electrical techniques to measure loss at low and high frequencies
Keywords :
ageing; cable insulation; coaxial cables; dielectric loss measurement; gamma-ray effects; insulation testing; nondestructive testing; polyethylene insulation; 500 kGy; Co; Hamon transform; cable insulation; coaxial signal cables; depolarising current; dielectric loss; gamma source; insertion loss; loss measurements; network analyser; nondestructive electrical techniques; polyethylene; radiation-induced ageing; Aging; Cable insulation; Coaxial cables; Current measurement; Dielectric loss measurement; Dielectric measurements; Dielectrics and electrical insulation; Frequency measurement; Loss measurement; Polyethylene;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1089-084X
Print_ISBN :
0-7803-4927-X
Type :
conf
DOI :
10.1109/ELINSL.1998.694854
Filename :
694854
Link To Document :
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