Title :
Precise aperture control of oxidized GaAs surface emitting laser using in-situ monitered oxidation process
Author :
Sai, Hironobu ; Koyarna, F. ; Iga, Kenichi
Author_Institution :
Rohm Co. Ltd.
Keywords :
Apertures; Gallium arsenide; Infrared surveillance; Laser theory; Monitoring; Optical control; Oxidation; Plasma temperature; Surface emitting lasers; Vertical cavity surface emitting lasers;
Conference_Titel :
Compound Semiconductors, 2003. International Symposium on
Print_ISBN :
0-7803-7820-2
DOI :
10.1109/ISCS.2003.1239994