DocumentCode :
2205783
Title :
High efficiency Ka-band second-harmonic peniotron
Author :
Dressman, L.J. ; McDermott, D.B. ; Hirata, Yasuhisa ; Galoagher, D.A. ; Luhmann, N.C.
Author_Institution :
Dept. of Appl. Sci., California Univ., Davis, CA, USA
fYear :
2000
fDate :
4-7 June 2000
Firstpage :
170
Abstract :
Summary form only given. A second-harmonic peniotron has been designed for high efficiency and immunity to mode competition from gyrotron interactions. A peniotron experiment at Tohoku University recently achieved an electron efficiency of 70% at the third harmonic, but since the cavity was only critically coupled, the device efficiency was a more modest 35%. In order to achieve high device efficiency, the UC Davis peniotron will employ an overcoupled interaction cavity. To ensure stability from competing gyrotron interactions, the peniotron will operate in the lowest order mode of a slotted four-vane circuit, the /spl pi//2 mode. The cavity is strongly diffraction coupled with a circuit efficiency of 84%. The 33 GHz, slotted second-harmonic peniotron with a 70 kV, 3.5 A, v/spl perp//v/sub z/=1.5, /spl Delta/v/sub z//v/sub z/=10%, axis-encircling electron beam is predicted to yield 130 kW with an electron efficiency of 63% and a device efficiency of 52%. The device is being constructed at UC Davis and will be driven by a recently developed Northrup Grumman Cusp gun.
Keywords :
gyrotrons; microwave tubes; /spl pi//2 mode; 130 kW; 3.5 A; 33 GHz; 70 kV; Northrup Grumman Cusp gun; circuit efficiency; electron efficiency; gyrotron interactions; high device efficiency; high efficiency Ka-band second-harmonic peniotron; lowest order mode; mode competition; overcoupled interaction cavity; slotted four-vane circuit; slotted second-harmonic peniotron; Bandwidth; Contracts; Coupling circuits; Electron beams; Gain; Gyrotrons; Physics; Polarization; Predictive models; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5982-8
Type :
conf
DOI :
10.1109/PLASMA.2000.854882
Filename :
854882
Link To Document :
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