• DocumentCode
    22061
  • Title

    Ultralow-Voltage High-Speed Flash ADC Design Strategy Based on FoM-Delay Product

  • Author

    Lin, James ; Mano, Ibuki ; Miyahara, Masaya ; Matsuzawa, Akira

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
  • Volume
    23
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    1518
  • Lastpage
    1527
  • Abstract
    This paper discusses the ultralow-voltage (ULV) design strategy for high-speed flash analog-to-digital converters (ADCs). A lower supply voltage decreases the energy consumption at the cost of conversion speed. In this paper, a new index, the figure-of-merit (FoM)-delay (FD) product, is introduced to provide a balance between the energy efficiency and conversion speed. As a prototype, a 0.5 V, 420-MS/s, and 7-bit, flash ADC is developed using a 90-nm CMOS technology to demonstrate the validity of ULV operation. To overcome the challenges associated with a reduced supply voltage, a double-tail latched comparator with a variable capacitance calibration technique using metal-oxide-metal capacitors is implemented. An all-digital time-domain delay interpolation technique further enhances the resolution with very little additional power consumption. Using two-way time-interleaving, the prototype ADC achieves an effective number of bits (ENOB) of 5.5 bits while operating at 420 MS/s consuming a total power of 4.1 mW. The lowest measured FoM is the 195 fJ/conv.-step during single-channel operation at 210 MS/s, which results in an extremely low FD product of 0.93 pJ × ns/conv.-step.
  • Keywords
    CMOS logic circuits; analogue-digital conversion; comparators (circuits); logic design; CMOS technology; FoM-delay product; ULV operation; all-digital time-domain delay interpolation technique; conversion speed; double-tail latched comparator; energy consumption; energy efficiency; figure-of-merit-delay product; high-speed flash analog-to-digital converters; metal-oxide-metal capacitors; power 4.1 mW; power consumption; size 90 nm; two-way time-interleaving; ultralow-voltage high-speed flash ADC design strategy; variable capacitance calibration technique; voltage 0.5 V; word length 7 bit; Ash; Calibration; Capacitance; Delays; Energy consumption; Method of moments; Power demand; Analog-to-digital converter (ADC); delay interpolation; figure-of-merit (FoM)-delay (FD) product; flash; high speed; ultralow voltage (ULV);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2340995
  • Filename
    6875984