DocumentCode :
2206151
Title :
A coupled thermal and electrical time-domain soft starter system model
Author :
Juds, Mark A. ; Lee, Kevin ; Solveson, Mark G. ; Berkopec, William E. ; Becker, James A.
Author_Institution :
Innovation Center, Eaton Corp., Milwaukee, WI, USA
Volume :
4
fYear :
2005
fDate :
2-6 Oct. 2005
Firstpage :
2607
Abstract :
A coupled thermal and electrical dynamic system model was developed to aid in determining the transient ratings of a medium voltage soft start motor starter for various motor and load combinations and cycles (start-run-stop). This model includes the medium voltage (4160 V) power circuit, the control algorithms (for a soft start scheme), the induction machine model, and a detailed transient thermal model. The formulation for the transient thermal model is based on the electrical analogy for thermal resistance, thermal capacitance and airflow. Soft starters can significantly attenuate the high torque transients and inrush currents that can occur with direct line starting of induction machines. The soft start scheme reduces the effective RMS voltage applied to the motor by controlling thyristors to switch "ON" at specific times during each half cycle. Average power thermal simulations and full time-domain simulations have been completed for the soft starter connected to a low voltage 200 hp induction machine. Experimental results provide verification for the thermal model and the dynamic electrical system. Additionally, a medium voltage 1000 hp induction machine was modeled.
Keywords :
induction motors; machine control; starting; thermal resistance; thyristors; time-domain analysis; 1000 hp; 200 hp; RMS voltage; dynamic electrical system; firing angle control; induction machine model; medium voltage soft start motor starter; power circuit; power thermal simulation; silicon controlled rectifier; thermal capacitance; thermal resistance; thyristor; time-domain simulation; transient thermal model; Coupling circuits; Electric resistance; Induction machines; Medium voltage; Power system modeling; Switches; Thermal loading; Thermal resistance; Time domain analysis; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
ISSN :
0197-2618
Print_ISBN :
0-7803-9208-6
Type :
conf
DOI :
10.1109/IAS.2005.1518828
Filename :
1518828
Link To Document :
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