DocumentCode :
2206155
Title :
Investigation of Random Rough Surface Effects in Interconnect Resistance Extraction Utilizing Effective Conductivity
Author :
Chen, Quan ; Wong, Ngai
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong
fYear :
2006
fDate :
14-17 Nov. 2006
Firstpage :
1
Lastpage :
4
Abstract :
Due to the decreasing skin depth in high-frequency analog and digital circuits, surface roughness is playing an increasingly important role in interconnect parasitic extraction. However, the inaccessibility of explicit surface expression and the complicated electromagnetic (EM) nature baffle the satisfactory solution to this kind of problems. In this paper, the impact of random surface roughness on the frequency-dependent resistance extraction for interconnects is quantitively evaluated by the concept of effective conductivity. The surface information is given in terms of statistical description instead of explicit functions. We combine the equivalent source method with the Monte Carlo simulation, called generalized equivalent source method (GESM), to analyze the behavior of EM wave on random rough surfaces. These techniques simplify the investigation of rough surface effects in interconnect parasitic extractions and full-wave analyses for signal integrity
Keywords :
integrated circuit interconnections; rough surfaces; surface electromagnetic waves; EM wave; GESM; Monte Carlo simulation; digital circuit; generalized equivalent source method; high-frequency analog circuit; interconnect resistance extraction; random rough surface effect; Conductivity; Data mining; Digital circuits; Frequency; Integrated circuit interconnections; Rough surfaces; Skin; Surface resistance; Surface roughness; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2006. 2006 IEEE Region 10 Conference
Conference_Location :
Hong Kong
Print_ISBN :
1-4244-0548-3
Electronic_ISBN :
1-4244-0549-1
Type :
conf
DOI :
10.1109/TENCON.2006.343796
Filename :
4142471
Link To Document :
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