DocumentCode :
2206162
Title :
Sensitivity analysis of compact polarimetry parameters to crop growth using simulated RADARSAT-2 SAR data
Author :
Shang, Jiali ; McNairn, Heather ; Charbonneau, Francois ; Chen, Zhaohua ; Jiao, Xianfeng
Author_Institution :
Agric. & Agri-Food Canada, Ottawa, ON, Canada
fYear :
2012
fDate :
22-27 July 2012
Firstpage :
1825
Lastpage :
1828
Abstract :
The availability of advanced satellite radar sensors (C-band RADARSAT-2 and X-band TerraSAR-X) provides significant opportunities for timely monitoring of crop growth. Recent studies revealed that many polarimetric SAR parameters are sensitive to crop Leaf Area Index (LAI). However the reduced swath coverage of fully polarimetric SAR limits the operational application of these modes for large regional monitoring activities. Compact polarimetry mode, on the other hand, permits much larger swath coverage than fully polarimetric SAR. This study investigates the sensitivity of compact polarimetry SAR parameters to crop LAI using simulated data from RADARSAT-2 imagery collected in Canada over two growing seasons. Results revealed that compact polarimetric decomposition parameters associated with volumetric scattering are well correlated with crop LAI. This suggests that compact polarimetric SAR can be an important data source for large scale crop growth monitoring.
Keywords :
crops; radar polarimetry; remote sensing by radar; sensitivity analysis; vegetation mapping; C-band satellite radar sensor; Canada; TerraSAR-X; X-band satellite radar sensor; advanced satellite radar sensors; compact polarimetry mode; compact polarimetry parameters; crop growth monitoring; crop leaf area index; growing seasons; polarimetric SAR parameters; sensitivity analysis; simulated RADARSAT-2 SAR data; swath coverage; Agriculture; Correlation; Monitoring; Polarimetry; Scattering; Sensitivity; Synthetic aperture radar; RADARSAT-2; compact polarimetry; crop LAI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
ISSN :
2153-6996
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2012.6351156
Filename :
6351156
Link To Document :
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