DocumentCode
2206256
Title
Modeling of IGBT resistive and inductive turn-on behavior
Author
Lu, L. ; Pytel, S.G. ; Santi, E. ; Bryant, A.T. ; Hudgins, J.L. ; Palmer, P.R.
Author_Institution
Dept. of Electr. Eng., South Carolina Univ., Columbia, SC, USA
Volume
4
fYear
2005
fDate
2-6 Oct. 2005
Firstpage
2643
Abstract
Although IGBT turn on losses can be comparable to turn off losses, IGBT turn on has not been as thoroughly studied in the literature. In the present work IGBT turn on under resistive and inductive load conditions is studied in detail through experiments, finite element simulations, and circuit simulations using physics-based semiconductor models. Under resistive load conditions, it is critical to accurately model the conductivity modulation phenomenon. Under clamped inductive load conditions at turn-on there is strong interaction between the IGBT and the freewheeling diode undergoing reverse recovery. Physics-based IGBT and diode models are used that have been proved accurate in the simulation of IGBT turn-off.
Keywords
circuit simulation; diodes; finite element analysis; insulated gate bipolar transistors; losses; semiconductor device models; IGBT modeling; circuit simulation; conductivity modulation phenomenon; finite element simulation; freewheeling diode; inductive load; physics-based semiconductor model; resistive load; reverse recovery; turn-on behavior; Circuit simulation; Conductivity; Equations; Finite element methods; Insulated gate bipolar transistors; Manufacturing; Semiconductor diodes; Stress; Switching converters; Tail;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
ISSN
0197-2618
Print_ISBN
0-7803-9208-6
Type
conf
DOI
10.1109/IAS.2005.1518833
Filename
1518833
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