• DocumentCode
    2206256
  • Title

    Modeling of IGBT resistive and inductive turn-on behavior

  • Author

    Lu, L. ; Pytel, S.G. ; Santi, E. ; Bryant, A.T. ; Hudgins, J.L. ; Palmer, P.R.

  • Author_Institution
    Dept. of Electr. Eng., South Carolina Univ., Columbia, SC, USA
  • Volume
    4
  • fYear
    2005
  • fDate
    2-6 Oct. 2005
  • Firstpage
    2643
  • Abstract
    Although IGBT turn on losses can be comparable to turn off losses, IGBT turn on has not been as thoroughly studied in the literature. In the present work IGBT turn on under resistive and inductive load conditions is studied in detail through experiments, finite element simulations, and circuit simulations using physics-based semiconductor models. Under resistive load conditions, it is critical to accurately model the conductivity modulation phenomenon. Under clamped inductive load conditions at turn-on there is strong interaction between the IGBT and the freewheeling diode undergoing reverse recovery. Physics-based IGBT and diode models are used that have been proved accurate in the simulation of IGBT turn-off.
  • Keywords
    circuit simulation; diodes; finite element analysis; insulated gate bipolar transistors; losses; semiconductor device models; IGBT modeling; circuit simulation; conductivity modulation phenomenon; finite element simulation; freewheeling diode; inductive load; physics-based semiconductor model; resistive load; reverse recovery; turn-on behavior; Circuit simulation; Conductivity; Equations; Finite element methods; Insulated gate bipolar transistors; Manufacturing; Semiconductor diodes; Stress; Switching converters; Tail;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-9208-6
  • Type

    conf

  • DOI
    10.1109/IAS.2005.1518833
  • Filename
    1518833