• DocumentCode
    2206470
  • Title

    Recent research work on plasma immersion ion implantation of semiconductors

  • Author

    Chu, Paul K.

  • Author_Institution
    Dept. of Phys. & Mater. Sci., City Univ. of Hong Kong, Kowloon, China
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    427
  • Abstract
    Plasma immersion ion implantation (PIII) has attracted much interest as both an R&D and production tool. PIII was originally envisioned as a conformal ion implantation technology for surface modification of materials, but it also offers the advantages of high dose rates even at low energy and single wafer implants over large areas. Such advantages are becoming very important for semiconductor manufacturing. particularly for 300 mm wafers. The technique has found many applications in semiconductor processing and is now a commercial technique in the ion-cut process to synthesize silicon-on-insulator (SOI). In this paper, some of our recent work oil the control of contamination in semiconductor PIII, steady-state direct-current PIII, as well as blue light emission from porous silicon treated by carbon PIII are described
  • Keywords
    integrated circuit manufacture; integrated circuit technology; ion implantation; semiconductor technology; silicon-on-insulator; surface contamination; surface treatment; 300 mm; SOI synthesis; Si; Si:C; blue light emission; conformal ion implantation technology; contamination control; high dose rates; ion cut process; plasma immersion ion implantation; porous Si; semiconductor manufacturing; semiconductor processing; single wafer implants; steady-state direct-current type; surface modification; Contamination; Implants; Ion implantation; Lighting control; Petroleum; Plasma immersion ion implantation; Production; Semiconductor device manufacture; Semiconductor materials; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.981510
  • Filename
    981510