Title :
Recent research work on plasma immersion ion implantation of semiconductors
Author_Institution :
Dept. of Phys. & Mater. Sci., City Univ. of Hong Kong, Kowloon, China
Abstract :
Plasma immersion ion implantation (PIII) has attracted much interest as both an R&D and production tool. PIII was originally envisioned as a conformal ion implantation technology for surface modification of materials, but it also offers the advantages of high dose rates even at low energy and single wafer implants over large areas. Such advantages are becoming very important for semiconductor manufacturing. particularly for 300 mm wafers. The technique has found many applications in semiconductor processing and is now a commercial technique in the ion-cut process to synthesize silicon-on-insulator (SOI). In this paper, some of our recent work oil the control of contamination in semiconductor PIII, steady-state direct-current PIII, as well as blue light emission from porous silicon treated by carbon PIII are described
Keywords :
integrated circuit manufacture; integrated circuit technology; ion implantation; semiconductor technology; silicon-on-insulator; surface contamination; surface treatment; 300 mm; SOI synthesis; Si; Si:C; blue light emission; conformal ion implantation technology; contamination control; high dose rates; ion cut process; plasma immersion ion implantation; porous Si; semiconductor manufacturing; semiconductor processing; single wafer implants; steady-state direct-current type; surface modification; Contamination; Implants; Ion implantation; Lighting control; Petroleum; Plasma immersion ion implantation; Production; Semiconductor device manufacture; Semiconductor materials; Silicon on insulator technology;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.981510