DocumentCode :
2206766
Title :
Preparation of high purity water with low concentration of dissolved oxygen (DO) and total organic carbon (TOC) for VLSI process
Author :
Wen, Ruimei ; Zhu, ZhiLiang ; Chen, Shenli
Author_Institution :
Electron. & Inf. Coll., Tongji Univ., Shanghai, China
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
475
Abstract :
To meet the needs of the rapid development of VLSI for high purity water, high quality equipment for high purity water with the capacity of 10t/h has been designed and built. The equipment contains triply connected membrane contactors working at 22°C under a pressure of 0.01 Mpa with N2 flow rate of 2.3 m3/h, a double RO and an 185 nm UV lamp. After the treatment by using the equipment the DO concentration can be decreased from 3000 μg/L down to 0.6 μg/L and the TOC concentration from 9000 μg/L down to 0.7 μg/L which satisfies the requirement of VLSI fabrication
Keywords :
VLSI; organic compounds; ultraviolet radiation effects; water; water treatment; 22 C; H2O; TOC concentration; UV lamp; VLSI fabrication; VLSI process; capacity; dissolved oxygen; flow rate; high purity water; total organic carbon; treatment; triply connected membrane contactors; Amorphous silicon; Atmosphere; Biomembranes; Contactors; Fabrication; Nitrogen; Oxidation; Oxygen; Random access memory; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6520-8
Type :
conf
DOI :
10.1109/ICSICT.2001.981521
Filename :
981521
Link To Document :
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