DocumentCode
2206801
Title
SiC Based Pressure Sensor for High-Temperature Environments
Author
Wieczorek, G. ; Schellin, B. ; Obermeier, E. ; Fagnani, G. ; Drera, L.
Author_Institution
Tech. Univ. of Berlin, Berlin
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
748
Lastpage
751
Abstract
Aim of the work presented herein is to develop a SiC based pressure sensor enabling measurements up to 3000 bar at temperatures in the range of 25degC to 400degC. For fabrication of the sensor chip various processing techniques potentially permitting effective membrane structuring are compared. The sensor chip features a centerboss membrane with four piezoresistors made from epitaxial layers. To limit movement of the centerboss, a bottom plate wafer made from SiC is bonded to the sensor chip. The bottom plate is thus acting as an overpressure safety feature. A tungsten-based metallization scheme tested up to 500degC is used. The housing of the sensor is fluid-free and employs a steel membrane for media separation.
Keywords
high-temperature electronics; membranes; piezoresistive devices; pressure measurement; pressure sensors; resistors; semiconductor device metallisation; silicon compounds; wide band gap semiconductors; SiC; bottom plate wafer; centerboss membrane; epitaxial layers; fluid-free sensor housing; media separation; overpressure safety feature; piezoresistors; pressure 3000 bar; pressure sensor; sensor chip fabrication; steel membrane; temperature 25 degC to 400 degC; temperature 500 degC; tungsten-based metallization scheme; Biomembranes; Epitaxial layers; Fabrication; Piezoresistive devices; Pressure measurement; Semiconductor device measurement; Sensor phenomena and characterization; Silicon carbide; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2007 IEEE
Conference_Location
Atlanta, GA
ISSN
1930-0395
Print_ISBN
978-1-4244-1261-7
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2007.4388508
Filename
4388508
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