• DocumentCode
    2206909
  • Title

    Optical diagnostic for examination of fast and thermal electrons from a helicon plasma source

  • Author

    Scharer, J. ; Akhtar, K. ; Pallet, E. ; White, B. ; Tysk, S.

  • Author_Institution
    Wisconsin Univ., Madison, WI, USA
  • fYear
    2002
  • fDate
    26-30 May 2002
  • Firstpage
    166
  • Abstract
    Summary form only given, as follows. Helicon waves are excited in an argon plasma discharge by a twisted double helix antenna operating at 13.56 MHz. Two optical probes are used. One can be inserted into a I cm diameter glass tube in the center of the plasma chamber (about 11 cm diameter). The other observes the plasma from the outside. The optical probes are measuring emission from the short-lifetime At II states. Software is used to correlate the optical emission to the phase of the RF source. The Ar II emission is measured along with B-dot and Langmuir probe measurements at different axial positions. 105 GHz and 10 GHz; interferometry are used to verify Langmuir probe measurements. The result is to compare Ar II emission to B/sub z/ phase velocity and plasma density to determine the traveling wave particle and background Maxwellian interactions. The background level and modulation index of the Ar II emission is measured for this reason.
  • Keywords
    antennas in plasma; argon; plasma density; plasma probes; plasma sources; Langmuir probe measurements; MM-wave interferometry; RF source; antenna-wave-particle interactions; background Maxwellian interactions; collisional high-pressure regimes; fast electrons; helicon plasma source; helicon waves; optical diagnostic; plasma discharge; plasma production; short-lifetime states; thermal electrons; traveling wave particle interactions; twisted double helix antenna; Argon; Electron optics; Optical interferometry; Plasma diagnostics; Plasma measurements; Plasma sources; Plasma waves; Position measurement; Probes; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
  • Conference_Location
    Banff, Alberta, Canada
  • Print_ISBN
    0-7803-7407-X
  • Type

    conf

  • DOI
    10.1109/PLASMA.2002.1030371
  • Filename
    1030371