• DocumentCode
    2207502
  • Title

    Optimized absorber designs for electromagnetic compatibility applications

  • Author

    Liu, Kefeng ; Kilpela, James P.

  • Author_Institution
    Ray Proof Shielding Syst. Corp., Amesbury, MA, USA
  • fYear
    1993
  • fDate
    9-13 Aug 1993
  • Firstpage
    289
  • Lastpage
    292
  • Abstract
    An absorber development program is discussed. The design curve a new family of 8-ft absorbers with innovative tip designs is shown. It has a tip in the form of a truncated pyramid and demonstrates a better than 27-dB performance in the 30-200-MHz frequency range. By using this 8-ft absorber, one is able to design 10-m semianechoic chambers having better than ±2-dB deviation from ideal open field test site in the theoretical chamber prediction model used. It is concluded that a global absorber optimization design technique can dramatically improve the performance of absorbers for EMC (electromagnetic compatibility) applications. Using this absorber design, it is possible to design semianechoic chambers to meet or surpass the performance requirements for indoor emission testing without having to use a complicated chamber shape
  • Keywords
    anechoic chambers; electromagnetic compatibility; electromagnetic interference; electromagnetic wave absorption; 10 m; 30 to 200 MHz; 8 ft; EMC; HF; VHF; absorber development program; chamber prediction model; design curve; electromagnetic compatibility applications; global absorber optimization design; indoor emission testing; open field test site; semianechoic chambers; tip designs; truncated pyramid; Design optimization; Electromagnetic compatibility; Electromagnetic scattering; Electromagnetic shielding; Electronic equipment testing; Performance analysis; Shape; Solid modeling; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-1304-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1993.473728
  • Filename
    473728