• DocumentCode
    2207790
  • Title

    Predicting fault prone modules by the Dempster-Shafer belief networks

  • Author

    Guo, Lan ; Cukic, Bojan ; Singh, Harshinder

  • Author_Institution
    Lane Dept. of CSEE, West Virginia Univ., Morgantown, WV, USA
  • fYear
    2003
  • fDate
    6-10 Oct. 2003
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    This paper describes a novel methodology for predicting fault prone modules. The methodology is based on Dempster-Shafer (D-S) belief networks. Our approach consists of three steps: first, building the D-S network by the induction algorithm; second, selecting the predictors (attributes) by the logistic procedure; third, feeding the predictors describing the modules of the current project into the inducted D-S network and identifying fault prone modules. We applied this methodology to a NASA dataset. The prediction accuracy of our methodology is higher than that achieved by logistic regression or discriminant analysis on the same dataset.
  • Keywords
    belief networks; fault diagnosis; knowledge engineering; software quality; software reliability; D-S belief networks; Dempster-Shafer; NASA dataset; attributes selection; discriminant analysis; fault prone modules prediction; induction algorithm; logistic procedure; logistic regression; prediction accuracy; predictors selection; Accuracy; Classification tree analysis; Fault diagnosis; Lab-on-a-chip; Logistics; NASA; Power system modeling; Predictive models; Software quality; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering, 2003. Proceedings. 18th IEEE International Conference on
  • ISSN
    1938-4300
  • Print_ISBN
    0-7695-2035-9
  • Type

    conf

  • DOI
    10.1109/ASE.2003.1240314
  • Filename
    1240314