DocumentCode
2207790
Title
Predicting fault prone modules by the Dempster-Shafer belief networks
Author
Guo, Lan ; Cukic, Bojan ; Singh, Harshinder
Author_Institution
Lane Dept. of CSEE, West Virginia Univ., Morgantown, WV, USA
fYear
2003
fDate
6-10 Oct. 2003
Firstpage
249
Lastpage
252
Abstract
This paper describes a novel methodology for predicting fault prone modules. The methodology is based on Dempster-Shafer (D-S) belief networks. Our approach consists of three steps: first, building the D-S network by the induction algorithm; second, selecting the predictors (attributes) by the logistic procedure; third, feeding the predictors describing the modules of the current project into the inducted D-S network and identifying fault prone modules. We applied this methodology to a NASA dataset. The prediction accuracy of our methodology is higher than that achieved by logistic regression or discriminant analysis on the same dataset.
Keywords
belief networks; fault diagnosis; knowledge engineering; software quality; software reliability; D-S belief networks; Dempster-Shafer; NASA dataset; attributes selection; discriminant analysis; fault prone modules prediction; induction algorithm; logistic procedure; logistic regression; prediction accuracy; predictors selection; Accuracy; Classification tree analysis; Fault diagnosis; Lab-on-a-chip; Logistics; NASA; Power system modeling; Predictive models; Software quality; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Automated Software Engineering, 2003. Proceedings. 18th IEEE International Conference on
ISSN
1938-4300
Print_ISBN
0-7695-2035-9
Type
conf
DOI
10.1109/ASE.2003.1240314
Filename
1240314
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