Abstract :
The following topics are dealt with: architectural trace-based functional coverage; multiprocessor verification; automatic formal correspondence checking; RTL microprocessor description; ISA microprocessor description; automatic online test program generation; cooperation scheme; Samsung reconfigurable processor verification framework; deterministic ATPG; low capture power testing; dual-LFSR reseeding; fully symbolic timed forward model checking; bug localization; processor designs; zamiaCAD framework; energy efficient performance; SysML model generation; two-way multicasting; test data compression; CGRA executable code verification; memory dependence violation; progressive-BackSpace; efficient predecessor computation; post-silicon debug; RTL IP verification; RTL IP redesign; RTL-to-TLM abstraction; and TLM synthesis.
Keywords :
automatic test pattern generation; circuit CAD; data compression; formal verification; integrated circuit design; integrated circuit testing; low-power electronics; microprocessor chips; multiprocessing systems; power aware computing; reconfigurable architectures; CGRA executable code verification; ISA microprocessor description; RTL IP redesign; RTL IP verification; RTL microprocessor description; RTL-to-TLM abstraction; Samsung reconfigurable processor verification framework; SysML model generation; TLM synthesis; architectural trace-based functional coverage; automatic formal correspondence checking; automatic online test program generation; bug localization; cooperation scheme; deterministic ATPG; dual-LFSR reseeding; efficient predecessor computation; energy efficient performance; fully symbolic timed forward model checking; low capture power testing; memory dependence violation; multiprocessor verification; post-silicon debug; processor designs; progressive-BackSpace; test data compression; two-way multicasting; zamiaCAD framework;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2012 13th International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-4441-8
DOI :
10.1109/MTV.2012.26
