DocumentCode
2208055
Title
Investigation of local and global features for face detection
Author
Pereira, Eanes ; Gomes, Herman ; Moura, Eduardo ; Carvalho, João ; Zhang, Tong
Author_Institution
Center for Electr. Eng. & Inf., Fed. Univ. of Campina Grande, Paraíiba, Brazil
fYear
2011
fDate
11-15 April 2011
Firstpage
114
Lastpage
121
Abstract
This work is concerned with the empirical evaluation of a set of local and global features under the context of frontal (including semi-profile) and full profile face classification. Integral LBP, Integral Histograms, PCA and Optimized Face Ratios features have been evaluated using SVM classifiers. A data set of about 14,000 face and 300,000 non face images has been used in the experiments. Face images were obtained from well known public face research databases, such as BioID, Color Feret, CMU PIE, among others. The PCA-SVM classifier presented best overall results for both frontal and full profile faces whereas the classifier based on Face Ratios presented the lowest classification rates. A weighted combination of all classifiers yielded high True Positive (TPR) and True Negative (TNR) rates: 91.7% and 100%, respectively, for the frontal face experiments; 99.59% and 99.62%, respectively, for the profile face experiments. These results indicate that the evaluated features are very suitable to the problem of face detection and that a simple classifier combination improves individual classifiers performance.
Keywords
face recognition; feature extraction; image classification; principal component analysis; support vector machines; SVM classifiers; face detection; frontal profile face classification; global face feature; integral LBP; integral histogram; local binary patterns; local face feature; optimized face ratio; principal component analysis; support vector machines; Face; Face detection; Feature extraction; Genetic algorithms; Histograms; Principal component analysis; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Multimedia, Signal and Vision Processing (CIMSIVP), 2011 IEEE Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-9913-7
Type
conf
DOI
10.1109/CIMSIVP.2011.5949242
Filename
5949242
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