Title :
A Defect Inspection Algorithm For LCD Touch Screen
Author :
Lu, Zongqing ; Peng, Yonglin
Author_Institution :
Sch. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
Abstract :
Liquid Crystal Display (LCD) touch screen has been applied to many consumer electronic products, such as cell phone, PDA, GPS, etc. Because LCD touch screen has unique Indium Tin Oxide (ITO) pattern, there is no special defect inspection algorithm designed for LCD touch screen. However, the quality control of the LCD touch screen in the production line is very important to minimize costs and maximize product quality. This research will present algorithms used for ITO pattern defects inspection of LCDs touch screen. Here, a complete design and implementation of a sequence of algorithmic components to identify ITO pattern defects is described. A preliminary automatic defects inspection system based on the algorithms will be also introduced.
Keywords :
Global Positioning System; automatic optical inspection; cellular radio; indium compounds; liquid crystal displays; notebook computers; quality control; tin compounds; touch sensitive screens; GPS; ITO; LCD touch screen; PDA; automatic defects inspection; cell phone; consumer electronic products; indium tin oxide pattern; liquid crystal display; quality control; Algorithm design and analysis; Cellular phones; Consumer electronics; Costs; Global Positioning System; Indium tin oxide; Inspection; Liquid crystal displays; Production; Quality control;
Conference_Titel :
Information Science and Engineering (ICISE), 2009 1st International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-4909-5
DOI :
10.1109/ICISE.2009.18