• DocumentCode
    2208218
  • Title

    An improved model of the SEERS diagnostic method

  • Author

    Brinkmann, R.P.

  • Author_Institution
    Infineon Technol. AG, Germany
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    192
  • Abstract
    Summary form only given. The availability of a reliable and efficient method for monitoring the plasma electron density is mandatory for the practical realization of any closed-loop plasma control. In the past, however, diagnostic methods were either prohibitively expensive for any commercial use (e.g., microwave interferometry), provided only indirect information (such as bias voltage, reflected power, or optical emission intensity), or potentially disturbed the process plasma itself (Langmuir probes). SEERS, or self-excited electron resonance spectroscopy, is a novel diagnostic method that overcomes these limitations: It enables the real-time measurement of the electron density in RF driven plasma systems without any form of process contamination. Using the improved plasma model, a parameter study is presented which investigates the response of the SEERS signal to changes in the underlying system parameters, in particular the pressure and the composition of the gas, and the magnitude of the driving RF power. A comparison to experimental data is given.
  • Keywords
    plasma density; plasma diagnostics; Langmuir probes; RF driven plasma systems; SEERS diagnostic method; bias voltage; closed-loop plasma control; diagnostic method; electron density; gas composition; microwave interferometry; optical emission intensity; plasma electron density; real-time measurement; reflected power; self-excited electron resonance spectroscopy; Availability; Electrons; Microwave theory and techniques; Monitoring; Optical interferometry; Plasma applications; Plasma density; Plasma diagnostics; Plasma measurements; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.854988
  • Filename
    854988