DocumentCode
2208219
Title
UV and visible emission processes in a moly-oxide discharge
Author
Giuliani, J.L. ; Pechacek, R.E. ; Petrov, G.M. ; Dasgupta, A. ; Bartschatc K ; Meger, R.A.
Author_Institution
Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
fYear
2002
fDate
26-30 May 2002
Firstpage
192
Abstract
Summary form only given, as follows. Due to the hazardous material designation of spent fluorescent lamps on board naval vessels, the Naval Research Laboratory has been investigating alternative lighting concepts which are free of mercury. A moly-oxide discharge driven by an inductively coupled RF coil at 13 MHz emits a broad spectrum in the visible range with strong line emission from the quintet spin levels of the Mo atom near the peak of the photopic curve. One limitation of such a discharge for direct white light applications is the near UV emission from the Mo septet resonance lines between 300 and 400 nm. Analysis of the excitation processes and channels for both the visible and UV emission will be presented based on a Boltzmann model for the electron energy distribution function and detailed atomic physics calculations for the cross sections. The results indicate that a Mo partial pressure of -10 mTorr or more will render the resonance lines optically thick and concurrently increase the visible emission. Calibrated spectroscopic measurements throughout the UV and visible region will be reported as a function of power and pressure and compared, through actinometry, with the theoretical simulations.
Keywords
calibration; emission; high-frequency discharges; molybdenum compounds; plasma diagnostics; ultraviolet spectra; visible spectra; 13 MHz; 300 to 400 nm; Boltzmann model; Mo partial pressure; Mo septet resonance lines; UV emission; UV emission processes; alternative lighting concepts; atomic physics; calibrated spectroscopic measurements; direct white light; electron energy distribution function; excitation processes; hazardous material; inductively coupled RF coil; moly-oxide discharge; naval vessels; near UV emission; optically thick resonance lines; spent fluorescent lamps; visible emission; visible emission processes; visible spectrum; Atomic measurements; Coils; Distribution functions; Electron emission; Fluorescent lamps; Hazardous materials; Laboratories; Physics; Radio frequency; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
Conference_Location
Banff, Alberta, Canada
Print_ISBN
0-7803-7407-X
Type
conf
DOI
10.1109/PLASMA.2002.1030420
Filename
1030420
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