• DocumentCode
    2208264
  • Title

    Bubbles and breakdown of liquid dielectrics

  • Author

    Orobeynikov, S. M K ; Sinikh, Yu.N.

  • Author_Institution
    Lab. of Electr. Eng. Mater., Novosibirsk State Tech. Univ., Russia
  • Volume
    2
  • fYear
    1998
  • fDate
    7-10 Jun 1998
  • Firstpage
    603
  • Abstract
    According to the bubble model the cause of breakdown is the bubbles of micron sizes that exist at electrodes. Several reasons of stationary bubbles existence and emergency on electrodes are discussed. The appearance of “effective” electron in the bubble at short pulses is determined by polar admixtures at electrodes and lead to discharges in it. Emergence of surface and space charge near bubbles poles lead to bubbles deformation due to Coulomb forces. Bubble elongation causes field increase in liquid near bubble poles. Breakdown initiates in liquid phase when this field reaches critical value that depends on the liquid sample and the polarity of initiating electrode. The equation of bubble growth is computed. The basic factors that define electrical strength in model are external factors: the pressure, temperature; properties of liquid: dielectric permittivity, vapour pressure, viscosity, surface tension, density, pulse voltage parameters: the rate of pulse rise, pulse width; properties of liquid-electrode interface that determine charge injection. This performs to compute the well-known breakdown dependencies
  • Keywords
    bubbles; dielectric liquids; electric breakdown; Coulomb force; breakdown; bubble; deformation; discharge; electrical strength; electrode; liquid dielectric; polar admixture; space charge; surface charge; Dielectric breakdown; Dielectric liquids; Electric breakdown; Electrodes; Electrons; Equations; Space charge; Space vector pulse width modulation; Surface discharges; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-4927-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1998.694865
  • Filename
    694865