• DocumentCode
    2208442
  • Title

    Concurrent error detection in analog and mixed-signal integrated circuits

  • Author

    Lubaszewski, Marcelo ; Mir, Salvador ; Rueda, Adoración ; Huertas, José L.

  • Author_Institution
    TIMA, Grenoble, France
  • Volume
    2
  • fYear
    1995
  • fDate
    13-16 Aug 1995
  • Firstpage
    1151
  • Abstract
    For many years, on-line testing techniques have been developed for digital circuits using error-detecting codes. More recently, some approaches on concurrent error detection for analog and mixed-signal circuits have been proposed. The techniques based on partial hardware replication and on balance checking are broadly addressed in this paper. Other approaches are briefly discussed
  • Keywords
    analogue integrated circuits; error detection; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; analog integrated circuits; balance checking; concurrent error detection; mixed-signal integrated circuits; partial hardware replication; Analog circuits; Circuit faults; Circuit testing; Digital circuits; Fabrication; Hardware; Mixed analog digital integrated circuits; Performance evaluation; Signal processing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-2972-4
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1995.510299
  • Filename
    510299