DocumentCode
2208442
Title
Concurrent error detection in analog and mixed-signal integrated circuits
Author
Lubaszewski, Marcelo ; Mir, Salvador ; Rueda, Adoración ; Huertas, José L.
Author_Institution
TIMA, Grenoble, France
Volume
2
fYear
1995
fDate
13-16 Aug 1995
Firstpage
1151
Abstract
For many years, on-line testing techniques have been developed for digital circuits using error-detecting codes. More recently, some approaches on concurrent error detection for analog and mixed-signal circuits have been proposed. The techniques based on partial hardware replication and on balance checking are broadly addressed in this paper. Other approaches are briefly discussed
Keywords
analogue integrated circuits; error detection; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; analog integrated circuits; balance checking; concurrent error detection; mixed-signal integrated circuits; partial hardware replication; Analog circuits; Circuit faults; Circuit testing; Digital circuits; Fabrication; Hardware; Mixed analog digital integrated circuits; Performance evaluation; Signal processing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location
Rio de Janeiro
Print_ISBN
0-7803-2972-4
Type
conf
DOI
10.1109/MWSCAS.1995.510299
Filename
510299
Link To Document