DocumentCode
2208471
Title
Two-Way Multicasting for Test Data Compression
Author
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Chen, Wei-Shun
fYear
2012
fDate
10-13 Dec. 2012
Firstpage
60
Lastpage
64
Abstract
This paper presents a two-way multicasting scan (TMS) architecture for test data compression. TMS records the difference address between neighboring broadcasts using less control bits to achieve two-directional cascaded broadcastings. Analyses on test pattern compatibility are made to determine the scan chain order so as to minimize the total number of broadcasts. In addition, the volume of sub-pattern data which is sent into scan chains in a broadcast is largely reduced by the partial data reuse method. Experimental results show that with smaller hardware overhead TMS achieves a better compression effect than similar work conducting multicast scan.
Keywords
compression; multicasting; scan-chain;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification (MTV), 2012 13th International Workshop on
Conference_Location
Austin, TX, USA
ISSN
1550-4093
Print_ISBN
978-1-4673-4441-8
Type
conf
DOI
10.1109/MTV.2012.16
Filename
6519736
Link To Document