DocumentCode :
2208471
Title :
Two-Way Multicasting for Test Data Compression
Author :
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Chen, Wei-Shun
fYear :
2012
fDate :
10-13 Dec. 2012
Firstpage :
60
Lastpage :
64
Abstract :
This paper presents a two-way multicasting scan (TMS) architecture for test data compression. TMS records the difference address between neighboring broadcasts using less control bits to achieve two-directional cascaded broadcastings. Analyses on test pattern compatibility are made to determine the scan chain order so as to minimize the total number of broadcasts. In addition, the volume of sub-pattern data which is sent into scan chains in a broadcast is largely reduced by the partial data reuse method. Experimental results show that with smaller hardware overhead TMS achieves a better compression effect than similar work conducting multicast scan.
Keywords :
compression; multicasting; scan-chain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV), 2012 13th International Workshop on
Conference_Location :
Austin, TX, USA
ISSN :
1550-4093
Print_ISBN :
978-1-4673-4441-8
Type :
conf
DOI :
10.1109/MTV.2012.16
Filename :
6519736
Link To Document :
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