DocumentCode
2208643
Title
On the effectiveness of EMIRR to qualify OpAmps
Author
Aimonetto, Marco Brignone ; Fiori, Franco
Author_Institution
Electronics and Telecom. Dpt., Politecnico di Torino, Italy
fYear
2015
fDate
16-22 Aug. 2015
Firstpage
40
Lastpage
44
Abstract
This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.
Keywords
Interference; Logic gates; Power measurement; Radio frequency; Standards; Transistors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location
Dresden, Germany
Print_ISBN
978-1-4799-6615-8
Type
conf
DOI
10.1109/ISEMC.2015.7256129
Filename
7256129
Link To Document