DocumentCode :
2208757
Title :
Coupling High Force Sensitivity and High Stiffness in Piezoresistive Cantilevers with Embedded Si-Nanowires
Author :
Naeli, Kianoush ; Brand, Oliver
Author_Institution :
Georgia Inst. of Technol., Atlanta
fYear :
2007
fDate :
28-31 Oct. 2007
Firstpage :
1065
Lastpage :
1068
Abstract :
Using a single-mask add-on process module, two usually non-coexistent properties of cantilevers, large stiffness and large force sensitivity, are summoned in a single device. To achieve this, a stress-concentrating (SC) principle is used: instead of decreasing the cantilever thickness, which is the conventional approach in increasing its force sensitivity, the stress is locally concentrated in piezoresistive beams or wires. Hence, with a negligible decrease in stiffness, a higher sensitivity is obtained. Results of finite element simulations and experimental data confirm the feasibility of the proposed design. Fabricated cantilevers with implemented stress-concentrating silicon nanowires show a more than 5-fold improvement in force sensitivity compared to a conventional cantilever with the same dimensions, while maintaining the same stiffness. With thinner wires, the sensitivity increases 8-fold at the expense of a 15% decrease in stiffness.
Keywords :
cantilevers; finite element analysis; nanowires; piezoresistive devices; silicon; Si; coupling high force sensitivity; embedded nanowires; finite element simulations; high stiffness; piezoresistive beams; piezoresistive cantilevers; piezoresistive wires; stress-concentrating principle; Atomic force microscopy; Force sensors; Laser beams; Nanowires; Piezoresistance; Resonance; Resonant frequency; Stress; Structural beams; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2007 IEEE
Conference_Location :
Atlanta, GA
ISSN :
1930-0395
Print_ISBN :
978-1-4244-1261-7
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2007.4388589
Filename :
4388589
Link To Document :
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