Title :
Comprehensive power bus noise analysis
Author :
Choy, C.S. ; Chan, C.F. ; Ku, M.H.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Abstract :
This paper gives a comprehensive analysis on power bus noise. Power noise normally occurs in high speed devices and must be taken seriously as it will cause circuit malfunction. The characteristics of this noise and how it should be modeled are discussed. The design concept of a load adaptive driver is explained
Keywords :
CMOS integrated circuits; busbars; driver circuits; integrated circuit modelling; integrated circuit noise; CMOS IC; circuit malfunction; high speed device; load adaptive driver; power bus noise; Bonding; Circuit noise; Driver circuits; Inductance; Integrated circuit interconnections; MOSFETs; Packaging; Propagation delay; Semiconductor device modeling; Wires;
Conference_Titel :
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2972-4
DOI :
10.1109/MWSCAS.1995.510315
