Title :
Modeling of a two stage RF plasma reactor for SiC deposition
Author :
Petrov, G.M. ; Giuliani, J.L.
Author_Institution :
Berkeley Res. Associates, Springfield, VA, USA
Abstract :
Summary form only given. Chemical vapor deposition (CVD) is often used for the growth of Silicon Carbide (SiC) films. The precursor gases, silane and methane, flow through a quartz tube at atmospheric pressure with a graphite susceptor located downstream of the inter. The conventional method for growing SiC films is to heat the susceptor by low frequency (kHz) RF which in turn heats the gas by thermal transfer up to several thousand K and forms reactive species near the growth substrate. The high temperature and pressure of the gas is thought to be one cause of film defects such as micropipes. An alternative approach, plasma-enhanced CVD, can be applied wherein, an upstream plasma forms reactive species in non-equilibrium conditions. The neutral gas temperature and pressure may then be substantially reduced, while defects are reduced as long as the destructive effects of ion bombardment are limited. The present research focuses on the design of a two stage RF reactor in which a high frequency RF (MHz) antenna is added upstream of the substrate to form the plasma. We have developed a 1-D flow code to investigate various design options for the reactor. The model includes electromagnetic coupling, electron heating and plasma chemistry involving silane and methane reactions. 37 species and 183 reactions are considered. The model addresses kinetic and transport properties which occur in the gas phase and can be used to predict the axial profiles of the electron and gas temperature, neutral and charged species and particle and energy fluxes. We report on the impact of the design parameters: input power, gas pressure, RF frequency, flow rate, and tube dimensions.
Keywords :
antennas in plasma; electromagnetic coupling; plasma CVD; plasma CVD coatings; plasma chemistry; plasma devices; plasma flow; plasma kinetic theory; plasma pressure; plasma radiofrequency heating; plasma temperature; plasma transport processes; silicon compounds; 1D flow code; RF frequency; SiC; SiC deposition; SiC films; SiH/sub 4/; atmospheric pressure; axial profiles; charged species; chemical vapor deposition; defects; design; design options; design parameters; destructive effects; electromagnetic coupling; electron heating; electron temperature; energy fluxes; film defects; flow rate; gas phase; gas pressure; gas temperature; graphite susceptor; growth substrate; high frequency RF antenna; input power; ion bombardment; kinetic properties; low frequency RF; methane; methane reactions; micropipes; neutral gas pressure; neutral gas temperature; neutral species; nonequilibrium conditions; particle fluxes; plasma chemistry; plasma-enhanced CVD; precursor gases; pressure; quartz tube; reactive species; silane; silane reactions; temperature; thermal transfer; transport properties; tube dimensions; two stage RF plasma reactor; two stage RF reactor; upstream plasma; Atmospheric modeling; Atmospheric-pressure plasmas; Electrons; Heat transfer; Inductors; Plasma chemistry; Plasma temperature; Radio frequency; Silicon carbide; Substrates;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.855014