• DocumentCode
    2209098
  • Title

    An empirical approach for software fault prediction

  • Author

    Kaur, Arashdeep ; Brar, Amanpreet Singh ; Sandhu, Parvinder S.

  • Author_Institution
    Deptt. Of CSE, Amity Univ., Noida, India
  • fYear
    2010
  • fDate
    July 29 2010-Aug. 1 2010
  • Firstpage
    261
  • Lastpage
    265
  • Abstract
    Measuring software quality in terms of fault proneness of data can help the tomorrow´s programmers to predict the fault prone areas in the projects before development. Knowing the faulty areas early from previous developed projects can be used to allocate experienced professionals for development of fault prone modules. Experienced persons can emphasize the faulty areas and can get the solutions in minimum time and budget that in turn increases software quality and customer satisfaction. We have used Fuzzy C Means clustering technique for the prediction of faulty/ non-faulty modules in the project. The datasets used for training and testing modules available from NASA projects namely CM1, PC1 and JM1 include requirement and code metrics which are then combined to get a combination metric model. These three models are then compared with each other and the results show that combination metric model is found to be the best prediction model among three. Also, this approach is compared with others in the literature and is proved to be more accurate. This approach has been implemented in MATLAB 7.9.
  • Keywords
    formal specification; fuzzy set theory; pattern clustering; project management; software fault tolerance; software metrics; software quality; NASA project; code metrics; combination metric model; customer satisfaction; fault prone module; fault proneness; fuzzy C means clustering; project development; software fault prediction; software quality; software requirement; Classification algorithms; Clustering algorithms; Measurement; Predictive models; Software; Software algorithms; Testing; Clustering; FCM; Fault prediction; Metrics; Software Quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Information Systems (ICIIS), 2010 International Conference on
  • Conference_Location
    Mangalore
  • Print_ISBN
    978-1-4244-6651-1
  • Type

    conf

  • DOI
    10.1109/ICIINFS.2010.5578698
  • Filename
    5578698