Title :
A simple mean clock skew estimation algorithm for clock distribution networks in presence of random process variations and nonuniform substrate temperature
Author :
Herath, Vijitha R. ; Noé, Reinhold
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Peradeniya, Peradeniya, Sri Lanka
fDate :
July 29 2010-Aug. 1 2010
Abstract :
This paper presents a simple algorithm to estimate mean clock skew of a well balanced H-tree clock distribution network. The clock skew is a result of random process variations and nonuniform die temperature. The available literature separately discusses how to estimate clock skew in the presence of random process variations and nonuniform die temperature. This work combines the effects of both phenomena into a single equation using some simplifying assumptions. The derived equation can recursively apply to a well-balanced H-tree clock distribution network to estimate the mean clock skew. The proposed method estimates the mean clock skew with a high degree of accuracy. The delay distributions are assumed normal in the calculation. The computational effort needed for the proposed algorithm is O(N).
Keywords :
VLSI; clock distribution networks; delays; integrated circuit interconnections; integrated circuit modelling; random processes; recursive estimation; substrates; trees (mathematics); VLSI circuits; delay distributions; die temperature; interconnect delay; mean clock skew estimation algorithm; nonuniform substrate temperature; random process variations; recursive estimation method; well-balanced H-tree clock distribution networks; Clocks; Delay; Equations; Estimation; Mathematical model; Program processors; Temperature distribution; Clock distribution network; clock skew; process variations; temperature gradient;
Conference_Titel :
Industrial and Information Systems (ICIIS), 2010 International Conference on
Conference_Location :
Mangalore
Print_ISBN :
978-1-4244-6651-1
DOI :
10.1109/ICIINFS.2010.5578699