• DocumentCode
    2209486
  • Title

    Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization

  • Author

    Suehle, John S.

  • Author_Institution
    National Institute of Standards and Technology
  • fYear
    1993
  • fDate
    24-27 Oct 1993
  • Firstpage
    22
  • Lastpage
    34
  • Keywords
    Breakdown voltage; Capacitors; Current measurement; Design for quality; Dielectric breakdown; Dielectric measurements; Electric breakdown; Laboratories; Reproducibility of results; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1993 International
  • Type

    conf

  • DOI
    10.1109/IRWS.1993.666288
  • Filename
    666288
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2209486